1. Computed electron micrographs and defect identification
Author: By A. K. Head, P. Humble, L. M. Clarebrough, a.o
Library: Library of College of Science University of Tehran (Tehran)
Subject: Data processing ، Metals -- Defects,Data processing ، Electron microscopy
Classification :
QD
921
.
C62
2. Computed electron micrographs and defect identification
Author: By A.K. Head, P. Humble, L.M. Clarebrough, a.o.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electron microscopy-- Data processing.,Metals-- Defects-- Data processing.,cristallographie.,diffraction.,dislocation.,identification défaut.,physique.,Cristallographie-- Informatique.,Cristaux-- Défauts.,Électrons-- Diffraction.,Computersimulaties.,Electron microscopy-- Data processing.,Elektronendiffractie.,Elektronenmicroscopie.,Metall.,Metals-- Defects-- Data processing.,Mikrostruktur.,Roosterfouten.,SCIENCE-- Physics-- Crystallography.,Vastestoffysica.
